[Used Scanning probe microscope] PSIA XE-100

Technical specifications:

Mechanical:

• Sample size: up to 100 x 100 mm, up to 20 mm thick
• Sample mass: up to 500 g

X/Y Scanner:

• Scan range: 50x50 µm
• Resolution: < 0.15 nm

Z-Scanner:

• Scan range: 12 µm
• Resolution: < 0.05 nm

Available Testing Modes:

• Contact mode
• Non contact mode (for soft materials)
• Tapping mode (identification of mechanical properties – phase lag)

Applications:

• Identification of microstructure
• Characterization of material phases
• Phase imaging

MAker : PSIA

Model : XE-100

Mail : Soga1318@naver.com
Mobile : +821037623650