[Used 3D Optical Surface Profilers] Used 3D Optical Surface Profilers ZYGO NewView600

Maker : ZYGO

Model : NewView600

Mail : Soga1318@naver.com
Mobile : +821037623650

[Used ION SPUTTER] ION SPUTTER HITACHI E1010

Marjor 사양

명세서		E-1010	E-1020
방전 operaiton	유형	다이오드	다이오드
	전극 형태	링 (63mm 디아.)	링 (88mm 디아.)
	전압	DC 2.5Kv, 0.5kV	직류 2.5kV, 0.5kV
	현재	직류 0 ~ 30mA	직류 0 ~ 30mA
코팅 먹은 (AU)		10nm/min	60nm/min
견본	맥스. 직경	50mm	80mm
	고도	15mm	15mm
로터리 펌프		20L/min	50L/min
권력		단상 교류 100V 1kVA의 10 %,
치수	폭	35cm	35cm
	깊이	44cm	44cm
	고도	31cm	33cm
무게		29kg	31kg

Maker : HITACHI

Model : E1010

Mail : Soga1318@naver.com
Mobile : +821037623650

[Used EXPANDER] Aaron EXPANDER AR06EX

Mail : Soga1318@naver.com
Mobile : +821037623650

[Used Height Gauge]TESA MU Height Gauge

TESA-µHITE Height Gauge

The solution for the most varied metrology application

TESA-µHITE height gauge

provided with the following components;

1 TESA measuring support, granite measuring table, size 200 x 300 x 50 mm (00760203)

1 TESA-µHITE electronic length unit (00730054)

Compact design with measuring stand included - Sensor equipped with a system for coaxial measuring according to the Abbe principle or using an offset probe relative to the gauge axis.  Measures internal, external, height, depth, step and distance dimensions on geometric elements having either a flat, parallel or cylindrical surface. - Automatic detection of the culminating point on bores or shafts - dynamic probing with memory functions «max.», «min.» «max.- min.».   The whole system provides the best solution for measuring straightness, flatness and parallelism or inspecting axial and radial runouts depending on the chosen tool configuration.

• Ideal for workpiece inspection close to the production area
• 100 mm measuring span.
• 0.001 mm and 0.0001 mm or 0.0001 in and 0.00001 in scales intervals
• Max. perm. error as low as 2 µm (or 1µm when checking coaxiality).
• Integrated temperature sensor so that the coefficient of linear expansion of each gauge unit matches that of steel ( 11,5 x 10^-6  K^-1 ).
• Motorised measuring head for fast probing at each point.
• Automatic value capture, controlled over the stability of the measuring force, but also all measured values.
• Constant measuring force through the motor-driven actuator. Switchable.
• No manualcalculation needed.
• RS 232 data output with direct connection to TESA PRINTER SPC.
• Memory capacity for 99 single values.

Mail : Soga1318@naver.com
Mobile : +821037623650

[Used Scanning probe microscope] PSIA XE-100

Technical specifications:

Mechanical:

• Sample size: up to 100 x 100 mm, up to 20 mm thick
• Sample mass: up to 500 g

X/Y Scanner:

• Scan range: 50x50 µm
• Resolution: < 0.15 nm

Z-Scanner:

• Scan range: 12 µm
• Resolution: < 0.05 nm

Available Testing Modes:

• Contact mode
• Non contact mode (for soft materials)
• Tapping mode (identification of mechanical properties – phase lag)

Applications:

• Identification of microstructure
• Characterization of material phases
• Phase imaging

MAker : PSIA

Model : XE-100

Mail : Soga1318@naver.com
Mobile : +821037623650

[Used LCD Auto Prober]LCD Auto Prober 2set

Mail : Soga1318@naver.com
Mobile : +821037623650

[Used Microscope]LCD&WAFER Microscope NIKON ECLIPSE L300

stage : 14" x 12" (354 X 302mm)
Lens : 5x,10x,20x,50x,100x (Motorized revolving type)

Maker : NIKON
Model : ECLIPSE L300

Mail : Soga1318@naver.com
Mobile : +821037623650